Adhesive Contact of a Compliant Sphere to an Elastic Coated Substrate: The Thin Film Limit

Adhesive contact of a compliant sphere to an elastic coated substrate: the thin film limit

Experimental results for adhesive contacts on substrates coated with elastomeric thin films have recently been obtained by C. Tardivat and L. Léger (J. Adhesion Sci. Technol. 15 10551078 (2001)) by the so-called JKR test, which provides both adhesion energy and elastic modulus. These data show that on substrates coated with thin films the adhesion and effective elastic modulus of the sphere dep...

Analysis of a Compressed Thin Film Bonded to a Compliant Substrate: The Energy Scaling Law

We consider the deformation of a thin elastic film bonded to a thick compliant substrate, when the (compressive) misfit is far beyond critical. We take a variational viewpoint – focusing on the total elastic energy, i.e. the membrane and bending energy of the film plus the elastic energy of the substrate – viewing the buckling of the film as a problem of energy-driven pattern formation. We iden...

Wrinkling of a stiff thin film bonded to a pre-strained, compliant substrate with finite thickness.

A stiff thin film bonded to a pre-strained, compliant substrate wrinkles into a sinusoidal form upon release of the pre-strain. Many analytical models developed for the critical pre-strain for wrinkling assume that the substrate is semi-infinite. This critical pre-strain is actually much smaller than that for a substrate with finite thickness (Ma Y et al. 2016 Adv. Funct. Mater. (doi:10.1002/ad...

Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation

A data analysis procedure has been developed to estimate the contact area in an elasto-plastic indentation of a thin film bonded to a substrate. The procedure can be used to derive the elastic modulus and hardness of the film from the indentation load, displacement, and contact stiffness data at indentation depths that are a significant fraction of the film thickness. The analysis is based on Y...

Pseudo-Brewster and second-Brewster angles of an absorbing substrate coated by a transparent thin film.